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АСМ зонды
The cantilever is a key element of any scanning probe microscope, the properties and quality of which depends on the successful operation of the microscope in General. This is the basic measuring element of many types of probe microscopes. The right choice of the cantilever is one of the most important conditions for obtaining good AFM images. The most important component of AFM (Atomic force microscope) are the scanning probes of the cantilevers. The cantilever is a flexible beam (175х40х4 µm — average data) with a certain stiffness coefficient k (10-3 – 10 N/m), which is a micro needle. TipsNano company offers a wide range of cantilevers for a wide range of applications of scanning probe microscopy and full research samples.
Полуконтактные
Standard Tapping / Noncontact AFM probes with wide range of resonant frequencies and force constants.
Контактные
Standard Contact-Mode AFM probes.
Методика Модуляция Силы
Multi-functional AFM probes.
Проводящие
Electrical measurements AFM probes.
с Au покрытием иглы
с Pt покрытием иглы
с PtIr покрытием иглы
с TiN покрытием иглы
с W2C покрытием иглы
Магнитные
High resolution long lifetime magnetic probes. These probes allow to carry out both ordinary measurements with high accuracy and resolution to 20-30nm (MFM01, MFM10) and the measurements with special requirements such as the experiments in high external fields (MFM_HC) and imaging low coercive magnetic samples (MFM_LM).
Безыгольчатые
For chemical modifications, gluing spheres, etc.
Специализированные АСМ зонды
The cantilever is the most common sensor of the force interaction in atomic force microscopy. Any information about the surface atomic force microscope receives due to mechanical deflections of the cantilever beam, which are detected by an optical system. The AFM image in this case describes the spatial distribution of forces of interaction of the probe with the surface.
С высоким аспектным отношением
Whisker probe is an indispensable instrument for studying surfaces of unusual profile with narrow gaps. Standard cantilevers fail to investigate such objects with the necessary precision.
Супер острые
Super sharp silicon probes and diamond-like carbon DLC tips with typical curvature radius 1-2nm are extremely useful for obtaining high resolution of nanostructures. DLC tips have very long lifetime due to the high material durability.
С алмазным покрытием
Diamond Coated Probes are the best choice for any kind of long-term electrical characterizations. Stable and nondestructive, wear resistant probes with diamond coating allow you to make as many images as you want.
С отклонённой иглой
The best choice for the applications where the tip has to be placed exactly on the point of interest and/or has to be visible for Nanomanipulation.
C монокристаллической алмазной иглой
We would like to present you our new products – Unique probes with single crystal diamond tip for topography and electrical measurements. The probes that keep their sharpness during the whole working day and more! Using the probes you don’t need to choose between performance, lifetime and price anymore. Diamond manufacturing technology provides both sharp and wear-resistant, high quality AFM probes at a realistic price. The main probe advantages: High Resolution Diamond Tip – typical tip radius 7nm for both topography and electrical measurements. Endurance of Diamond – at least 10x Lifetime of Silicon. Standard AFM chip size. Sharp, single crystal diamond AFM probes give the AFM user all the known resilience benefits of hard diamond, with no compromise on image resolution.
СБОМ
SNOM — scanning near-field optical microscope, scanning near-field optical microscopy. In near-field optical microscopy uses different principles of construction of the image of object, which allow to overcome the difficulties associated with diffraction of light and to realize a spatial resolution of 10 nm and better. Higher resolution Bohm is achieved by detecting scattering of light from the object under study at distances smaller than the wavelength of light. In the case that the probe (detector) of the near-field microscope provided with a device for the spatial scan, the scanning device called optical near-field microscope. This microscope allows to obtain a raster image of surfaces and objects with a resolution below the diffraction limit.
Волоконные СБОМ зонды
SNOM PROBES – fiber probes with the formed aperture on the very tip end are specially designed for Scanning Near-Field Optical Microscopy. This method is used for investigating nanostructures at sub-wavelength scale. Probes are produced from standard single-mode Nufern fibers by the method of chemical etching that provides better optical efficiency in comparison with mechanical pulling. Probes perform all current modes of SNOM operation – transmission, reflection and collection. We offer 5 types of transmitted wavelength: MF001 – 400-550 nm MF002 – 450-600 nm MF003 – 600-770 nm MF004 – 780-970 nm MF005 – 980-1600 nm
ВОПГ
TipsNano supply with Highly Oriented Pyrolytic Graphite (HOPG). It’s a type of pure, highly laminar graphite used as an atomic-scale calibration standard for atomic force microscopy and scanning tunnelling microscopy. HOPG crystals are widely used as substrates in STM (Scanning Tunneling Microscopy). The most distinguishing features of HOPG which enable this application are a very smooth surface and electro conductivity. HOPG has a layered structure which makes sample preparation very simple. By pressing a double-stick tape to a HOPG piece and peeling it off, one gets a fresh conductive surface which is very smooth. This surface can be examined in STM or serve as a substrate for other materials under investigation. HOPG itself is an interesting object for STM investigations. One can measure the surface roughness, microscopic surface features, arrangement of the carbon atoms on the HOPG surface, etc. Besides, HOPG images at the atomic level can be used for calibrating STM for high-resolution imaging. 4 HOPG types (ZYA, ZYB, ZYD, ZYH) which differ by meaning of mosaic spread are available with sizes till 50x50mm. Both double-sided (DS) and single-sided (SS) HOPG pieces can be ordered. Double-sided HOPG can be used from both sides and its properties are not changed…
ZYA тип
HOPG of the highest quality. Mosaic Spread 0.4 ± 0.1 degrees. Available double- and single-sided. Double-sided HOPG can be used from both sides and its properties are not changed in depth. For one-sided piece the not working side is mat, glare less and can’t be cleaved. The number of working side cleavages of one-sided piece is limited in comparison with double sided substrate. The properties for one-sided piece are changed in depth.
ZYB тип
Highly Oriented Pyrolytic Graphite (HOPG) ZYB quality. Mosaic Spread 0.8 ± 0.2 degrees. Available double- and single-sided. Double-sided HOPG can be used from both sides and its properties are not changed in depth. For one-sided piece the not working side is mat, glare less and can’t be cleaved. The number of working side cleavages of one-sided piece is limited in comparison with double sided substrate. The properties for one-sided piece are changed in depth.
ZYD тип
Highly Oriented Pyrolytic Graphite (HOPG) ZYD quality. Mosaic Spread 1.7 ± 0.4 degrees. Available double- and single-sided. Double-sided HOPG can be used from both sides and its properties are not changed in depth. For one-sided piece the not working side is mat, glare less and can’t be cleaved. The number of working side cleavages of one-sided piece is limited in comparison with double sided substrate. The properties for one-sided piece are changed in depth.
ZYH тип
Highly Oriented Pyrolytic Graphite (HOPG) ZYH quality. Mosaic Spread 3.5 ± 1.5 degrees. Available only double-sided. Double-sided HOPG can be used from both sides and its properties are not changed in depth.
АСМ калибровка
To determine the credibility of studies by AFM — microscopy testing and calibration of microscope work and test the quality of probes (scale of X-, Y-, Z – coordinates, the radius of the tip of the cantilever, linearity and orthogonality of the axes of the scan). For calibration and determination of the working shapes of the probes used special test structures with known topography. For the calibration of microscopes in the scanning plane and vertically apply a diffraction grating with submicron sizes. In the absence of a specially manufactured calibration gratings, can be used as a test object to obtain atomic resolution fresh cleaved mica or highly oriented pyrolytic graphite (HOPG), because the parameters of the terrain are well known. Advantages of graphite as the test sample are: stable operation is output; a low concentration of point and line defects; low reactivity in atmospheric conditions; the possibility of obtaining atomically clean surface.
Калибровочные меры
TipsNano Co supplies with the full set of calibration standards for AFM lateral and vertical calibration including submicron calibration in X or/and Y direction, test grating for the tip shape estimation, Highly Oriented Pyrolytic Graphite (HOPG), DNA and PFM test samples.
Наборы калибровочных мер
Grating sets at optimal cost for AFM calibrationg and tip characterization.
Подложки
Тестовые образцы
TERS
TERS — Raman Spectroscopy with the enhancement of the tip. Measurements based on AFM microscopy. Mode TERS Raman spectrum is enhanced when a sharp tip with a gold coating approaches the illuminated sample surface. Using the cantilever of an AFM as an amplifier, measure the chemical properties of the sample in the nano-range by using the built-in Raman spectrometer, simultaneously obtaining topographic data by using ASM.
Кремниевые TERS зонды
TERS образец
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АСМ зонды
Полуконтактные
Контактные
Методика Модуляция Силы
Проводящие
с Au покрытием иглы
с Pt покрытием иглы
с PtIr покрытием иглы
с TiN покрытием иглы
с W2C покрытием иглы
Магнитные
Безыгольчатые
Специализированные АСМ зонды
С высоким аспектным отношением
Супер острые
С алмазным покрытием
С отклонённой иглой
C монокристаллической алмазной иглой
СБОМ
Волоконные СБОМ зонды
ВОПГ
ZYA тип
ZYB тип
ZYD тип
ZYH тип
АСМ калибровка
Калибровочные меры
Наборы калибровочных мер
Подложки
Тестовые образцы
TERS
Кремниевые TERS зонды
TERS образец
с Au покрытием иглы
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АСМ зонды с проводящим покрытием со стороны иглы, материал покрытия Au.
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CSG01/Au
₽
31 920,0
–
₽
86 200,0
Select options
CSG10/Au
₽
31 920,0
–
₽
86 200,0
Добавить в корзину
FMG01/Au
₽
31 920,0
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HA_C/Au
₽
26 400,0
–
₽
74 240,0
Добавить в корзину
HA_FM/Au
₽
74 240,0
Select options
HA_HR/Au
₽
26 400,0
–
₽
74 240,0
Select options
HA_NC/Au
₽
26 400,0
–
₽
74 240,0
Select options
NSG01/Au
₽
31 920,0
–
₽
86 200,0
Select options
NSG03/Au
₽
31 920,0
–
₽
86 200,0
Select options
NSG10/Au
₽
31 920,0
–
₽
86 200,0
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